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X-ray diffractometer

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MAGNETIC AND MAGNETOTRANSPORT PROPERTIES OF La0.7Ca0.3Mn1-x(Zn,Cu)xO3

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The crystallographic structure of the final products was examined by an X-ray diffractometer (Brucker D5005). Diagram shows preparation of La 0.7 Ca 0.3 Mn 1-x (Zn,Cu) x O 3 bulks.. Before investigating the magnetic and magnetotransport properties of the samples, we checked their quality based on an X-ray diffractometer.

Synthesis and X-ray powder diffraction, electrochemical, and genotoxic properties of a new azo-Schiff base and its metal complexes

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The authors wish to express their thanks to Prof Musa G¨ o˘ gebakan for the use of the X-ray diffractometer, and Prof Mehmet T¨ umer for electrochemistry measurements and his valuable discussion.

Tính chất điện, từ của hệ vật liệu pervoskite La1-x¬YxFeO3

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The samples we examined under X-ray diffraction using D5005-Bruker X-ray diffractometer and Cu-Kα radiation. RESULTS AND DISCUSSION The X-ray diffraction analysis of (La1-xYx)FeO3 indicates that all samples possess an orthorhombic structure. The lattice parameters (a, b, c), tolerance factor (t), and RA, RB radii of A and B of the samles (La1-xYx)FeO3 as function of Y content are listed in the table 1. 0.645 0.25. La0.75Y0.25FeO3. 0.645 0.45. La0.55Y0.45FeO3.

The existence of giant magnetocaloric effect and laminar structure in Fe73.5 xCrxSi13.5B9Nb3Cu1

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Alloy ribbons (6–8 mm wide, 20 mm thick) with nominal compositions Fe 73.5x Cr x Si 13.5 B 9 Nb 3 Cu 1 (x ¼ 1–5) were prepared by rapid quenching on a single copper wheel.. Structure of the ribbons was studied using a X-ray diffractometer Bruker D5005 with Cu–K a radiation. The XRD patterns of as-cast samples exhibit only one broad peak around 2y ¼ 45 1 , showing that the as-cast ribbons are amorphous..

Growth of CdS thin films by chemical bath deposition technique

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The X-ray diffraction (XRD) patterns of the as-deposited CdS thin film were recorded in a D5005 Brucker X-ray diffractometer with CuK α radiation λ = 1.54056°A, operated at 40 kV and 40 mA. The scanning speed was 0.030 °/s in the 2 θ range from 5° to 65°. The scanning electron microscopy (SEM) images of the obtained CdS thin films were taken on a JEOL5410.

Structure and luminescent property of a Sm3+ complex containing benzoyltrifluoroacetone and 1,2-bis[(anthracen-9-ylmethyl)amino]ethane ligands

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Single crystal X-ray diffraction data of the complex A2 was collected on the X-ray diffractometer (Bruker D8 Quest) at 298 K at the Faculty of Chemistry, University of Science, Vietnam National University, Hanoi. Absorption spectra of the ligands and the complexes were measured in dichloromethane at room temperature on Cary 5000 UV/Vis spectrometer at Faculty of Environmental Chemistry, Hanoi National University of Education..

Effects of the conditions of the microemulsion preparation on the properties of Fe3O4 nanoparticles

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Structure analysis of the dried powder of non-coated NPs was conducted by using a D5005 X-ray diffractometer with Cu K α radiation. XRD patterns of magnetite powder with concentration of Fe 2+ of 0.2 M in the aqueous phase.. Smaller particle size is difficult to obtain.. Microemulsion can produce small particles with diameter can be less than 10 nm, which coprecipitation technique cannot do [7].

Abnormal magnetic property in Fe-doped BaTio3 multiferroics

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Crystalline phase structure was studied using both the X-ray diffraction carried out on a Siemens D5000 X-ray diffractometer using CuKα ( λ = 1.54056 Å) radiation with the 2 θ angle in the range of 20-80 o and step size of 0.02 o , and using Raman scattering spectra measured on a Micro Raman LABRAM 1B system in the range of 100-1000 cm -1 . The absorption spectrum was measured on a Jasco 670 UV in the range of 300-1200 nm. All of the characterizations were performed at room temperature..

Synthesis, characterization and crystal structures of platinum(II) saccharinate complexes with 1,5-cyclooctadiene

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The intensity data of the platinum(II) complexes were collected on a Rigaku Xcalibur X-ray diffractometer with EOS CCD detector using Mo- Kα radiation (0.71073 Å) with ω -scan mode. Using an HKLF4 refinement in SHELXL, the fractional contribution of the major twin component was refined to 0.54 (4). Details of the data collection and structure refinement are given in Table 2..

Structure and Magnetic Properties of REMnO3 System

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The structure of the samples was examined in a Brucker D5005 X-ray diffractometer (Germany).. Magnetic measuments including Hysteresis loops and isothermal magnetization curves of the samples were performed in a vibrating sample magnetometer (VSM) DSM-880 in a magnetic fileds up to 13.5 kOe. Fig.1 presents the X-ray diffraction patterns of the REMnO 3 system (with RE = La, Nd, Pr).

(NHC)-Pd(II) complexes with hydrophilic nitrogen ligands: catalytic properties in neat water

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The authors are grateful to Ege University (Project 2012-BIL-42) and T ¨ UBA for financial support and to the Medicinal Plants and Medicine Research Center of Anadolu University, Eski¸sehir, Turkey, for the use of the X-ray diffractometer. Cross-Coupling Reactions

Magnetic Property and GMI Effect of MFE2O4 Nanoparticles

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A Bruker AXS D8 X-ray diffractometer was used to analyze the crystalline structure of the nanoparticles, and an FEI Morgagni 268 transmission electron microscope (TEM), operating at 60 kV in Department of Physic South Florida University (USF). The magnetic properties were measured using a commercial Physical Property Measurement System (PPMS) from Quantum Design in Department of Physic, HUS-VNU.. The sensing element coil (SEC) Co rich is about 10 mm with 50 rounds..

Tailoring optical and resistance properties of the functional CuAlxOy semiconductor for applications as thermal infrared imagers

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The structural characterization of the thin fi lm samples was carried out on an X-ray diffractometer (EQUINOX 5000, Thermo Scienti fi c) with Cu-K a X-ray radiation at 1.54056 Å of wavelength.. 1a shows X-ray diffraction (XRD) patterns of the samples in the temperature series (XRD patterns of the other two series are illustrated in Fig.

Influence of cooling rate on the properties of Fe73.5Si13.5B9Nb3Au1 ribbons

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The structure analysis of as-cast ribbons is performed using X-ray diffractometer Bruker D5005 using Cu-K α radiation. The magnetic properties of the ribbon are measured by VSM DMS 880 and Permagraph AMH - 401A Walker. We well known that when a liquid drop beat on the surface of the wheel, it will stretch on that a path before solidification and ejection from that and the higher speed of the wheel, the longer path..

Investigation of photocatalytic and antimicrobial activities of BaWO4-MoS2 nanoflowers

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The crystalline structure of the nanoparticles was identi fi ed by an X-ray diffractometer (XRD. The surface area was measured on approximately 250 mg of the samples using Kr at the liquid nitrogen temperature by a Micromeritics ASAP 2020 apparatus. The values of the surface areas were determined by the Brunauer e Emmet e Teller (BET) analysis of the physi e sorption isotherms.

One-step synthesis of hierarchical [B]-ZSM-5 using cetyltrimethylammonium bromide as mesoporogen

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No extra phase was observed within the sensitivity of the laboratory scale X-ray diffractometer (Rigaku Ultima-IV diffractometer, see Figure 1b). The addition of CTABr and incorporation of boron did not affect the crystallinity of the synthesized zeolites. According to Xue et al., the optimum CTABr/SiO 2 ratio that shows optimum mesopore and micropore formation is 0.1 for [Al]-ZSM-5 synthesis.

Synthesis and Characterization of Ni2+ -doped TiO2 Nanowires

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The crystalline phase of Ni 2+ -doped TiO 2 was studied by a Siemens D5005 Bruker, Germany X- ray diffractometer (XRD) with Cu-Kα1 irradiation (λ = 1.54056 Å). XRD patterns of the Ni 2+ -doped TiO 2 samples with different doping concentration.. Fig.1 presents the XRD patterns of Ni 2+ -doped TiO 2 samples with different doping concentration.. It can be seen that all samples show only anatase single phase regardless of Ni 2+ content.

X-ray và con ma

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X-ray và con ma Nguồn : dohoavn.net. Bài tập này hướng dẫn bạn áp vật liệu dạng X-ray để tạo một con ma , bây giờ bạn bắt đầu. Ở bài tập này bạn có thể sử dụng bất kỳ một model nào để thực hành , nếu bạn không có thì hãy download con ma ở địa chỉ sau. Mở file con ma trong 3dsmax . Nhấp chọn con ma và Nhấn phím M để mở bảng Material , trong bảng Multi/Subobject bạn nhấp nút Greem trong ID 1 . Ở đây chúng ta chỉ tạo vật liệu X-ray cho lớp da của con ma nên bạn chọn ID 1.

Lecture Principles of X-ray Crystallography

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Patterson, “The Scherrer formula for X-ray particle size determination,” Physical Review, vol. Molinet, “Geomatrical Theory of Diffraction(GTD) Part I: Foundation of the theory,” IEEE, vol. Molinet, “Geometrical Theory of Diffraction(GTD) Part II: Extensions and future trends of the theory,” IEEE, vol. KELLER, “Geometrical Theory of Diffraction,” Journal of the Optical Society of America, vol.

Synchrotron X-ray diffraction studies of β-Ca2−xMxSiO4 (M = Mg and Sr)

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A Computer Program for Rietveld Analysis of X-Ray and Neutron Powder Diffraction Patterns