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X-ray diffraction (XRD)

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Optical transition of Eu3+ in Mg(Al1-x Eux)2O4

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The X-ray diffraction (XRD) pattern measurements in the diffraction angle range of examined on samples of Mg(Al 1-x Eu x ) 2 O 4 containing different concentration of Eu 3+ ions are shown in Fig. It is found that XRD patterns of Mg(Al 1-x Eu x ) 2 O 4 strongly depend on concentrations of Eu 3+. 9 (a), in the sample with low content (x = 0.01), only strong sharp diffraction peaks corresponding to the structural phase of spinel MgAl 2 O 4 were observed.

Synthesis and characterization of iron dextrin copmlex

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The complex powder was thoroughly characterized by means of X-ray diffraction (XRD), scanning electron microscopy (SEM), Fourier-transform infrared (FT-IR), energy dispersive X-ray spectroscopy (EDX), and thermal analysis (DTA-TGA). The results indicated that the complex contains akaganeite (β-FeOOH) core bounded by dextrin molecules.. The akaganeite core ranges from 20 to 30 nm and the complex grain size varies from 40 to 60 nm.. There are commercial products containing the complex.

Reductant free green synthesis of magnetically recyclable MnFe2O4@SiO2-Ag coreshell nanocatalyst for the direct reduction of organic dye pollutants

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The morphology, composition, and magnetic properties of the resulting MnFe 2 O 4 @SiO 2 -Ag core-shell nanocatalyst were characterized by scanning electron microscope (SEM), transmission electron microscopy (TEM), thermogravimetric analysis (TGA), X-ray diffraction (XRD), vibrating sample magnetometer (VSM), and attenuated total reflectance-Fourier transform infrared spectroscopy (ATR-FTIR).

Thermoelectric property of Al-doped ZnO thin films based on solution synthesized by wet chemical reaction

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The X-ray diffraction (XRD) patterns of the AZO films are displayed in Fig. Three XRD diffraction peaks can be found at and 36.2 0 , corresponding to and (101) planes in the AZO films, respectively. The presence of these principal peaks reveals a random orientation of the nanocrystals.

Tổng hợp vật liệu huỳnh quang ba màu sử dụng trong các đèn huỳnh quang compact

104982-TT-EN.pdf

dlib.hust.edu.vn

Crystalline structure of the powder is investigated by X-ray diffraction (XRD) technique. Morphology and particle size of the phosphors are observed by scanning electron microscope (SEM) and transmission electron microscope (TEM)

Effect of Substrate Temperature on the Critical Current Density in the YBa2Cu3O7-x Superconducting Films

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For characterizing the YBCO films, The crystalline structures were examined by using the X-ray diffraction (XRD), the surface morphologies were compared by using the scanning electron microscopy (SEM). The magnetization data were measured by using the MPMS XL-5 system with the field applied parallel to the c-axis of the films.. In order to find the phase formation, the YBCO films fabricated at different substrate temperature were initially examined by XRD with the results are given in Fig.

In-situ synthesis of phthalocyanines on electrospun TiO2 nanofiber by solvothermal process for photocatalytic degradation of methylene blue

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Crystal structure analysis was carried out using X-ray diffraction (XRD) (Rigaku D/Max-IIIC diffractometer) with Cu-Kα line of 1.54 Å radiation and 2θ range of 10–90°. Photocatalytic degradation test. Photocatalytic degradation of MB for different nanofibers was investigated (i) in the dark with the presence of photocatalysts,. (ii) in the UV-light irradiation with the presence of the photocatalysts..

Synthesis and characterization of thermally stable camphor-based polyimide–clay nanocomposites

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The as-synthesized PI–MMT nanocomposites were subsequently characterized by Fourier transform infrared (FT-IR) spectroscopy, X-ray diffraction (XRD), and scanning electron microscopy (SEM). These studies showed the homogeneous dispersion of clay in the polyimide matrix with an increase in the thermal steadiness of the composite films on clay loadings..

Synthesis and investigation of langbeinite-related strontium- and iron-containing phosphates

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Thus, the samples of nominal composition K 3 − 2x Sr x Fe 2 (PO 4 ) 3 with x or 1.25 and phosphate K 3 Fe 2 (PO 4 ) 3 were fabricated using a solid-state reaction and investigated by powder X-ray diffraction (XRD), Fourier transform infrared (FTIR) spectroscopy, and differential thermal analysis (DTA) and thermogravimetric (TG) methods..

The hydrothermal synthesis of blue-emitting boron-doped CQDs and its application for improving the photovoltaic parameters of organic solar cell

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The X-ray diffraction (XRD) spectra of the non-doped and doped films of P3HT:PCBM.. P3HT:PCBM (200 nm. and 5 vol.% of B-CQDs doped, respectively. These results are also related to the morphological and structural properties of non-doped and B-CQDs doped P3HT:PCBM films.. and 5 vol.% of B-CQDs additive, respectively. AFM images of the non-doped and doped films of P3HT:PCBM..

Evaluation of a novel nanocrystalline hydroxyapatite powder and a solid hydroxyapatite/Chitosan-Gelatin bioceramic for scaffold preparation used as a bone substitute material

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The X-ray diffraction (XRD) performed on different scaffolds indicates that the incorporation of a certain amount of hydroxyapatite has no influence on the chitosan/gelatin network and at the same time, the organic matrix does not affect the crystallinity of hydroxyapatite. Transmission electron microscope (TEM) images show the needle-like crystal structure of hydroxyapatite nanoparticle. TGA reveals the thermal stability of the scaffolds..

Impact of geometry dimension on quality factor and masssensitivity of PZT thin film-based microcantilevers

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Figure 3a shows x-ray diffraction (XRD) θ-2θ scans of the PZT thin films grown on Pt/Ti/SiO 2 /SOI substrates by the PLD method. It is shown that no evidence of pyrochlore phase formation is observed within the resolution limits of the XRD. (a) X-ray diffraction (XRD) pattern and (b) Polarization hysteresis (P-E) loop of 1-m-thick PZT thin film grown on Pt/Ti/SiO 2 /SOI substrate..

X-RAY DIFFRACTION

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C s c a nhi u x tia X ơ ở ủ ễ ạ. Máy phân tích ph XRD. Đ c tr ng ph XRD c a m t s v t li u. Hình ch p x ụ ươ ng bàn tay c a bà Röngent ủ 22/12/1895. Gây ra hi n t ệ ượ ng phát quang m t s ở ộ ố ch t. Nhi u x tia X ễ ạ Huỳnh quang tia X. Phân tích c u trúc r n, v t li u… ấ ắ ậ ệ Xác đ nh hàm l ị ượ ng nguyên t có ố trong m u ẫ.

Synchrotron X-ray diffraction studies of β-Ca2−xMxSiO4 (M = Mg and Sr)

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A Computer Program for Rietveld Analysis of X-Ray and Neutron Powder Diffraction Patterns

Deposition of cadmium sulfide and zinc sulfide thin films by aerosol-assisted chemical vapors from molecular precursors

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The single crystal X-ray analysis of precursor 1 and 2 was carried out and cif files have been deposited in the Cambridge Crystallography Database. Table 1 shows comparative characteristic parameters of SSP 1 and 2 determined by single crystal X-ray diffraction.. Important structural refinement data of SSPs 1 and 2 determined from single crystal X-ray diffraction.. Single crystal X-ray structure of [Cd(S 2 CN n Bu 2 ) 2.

Melting Temperature of Iron at High Pressure: Statistical Moment Method Approach

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Hemley, In situ X-ray diffraction studies of iron to earth-core conditions, Phys. Rivers, Melting and crystal structure of iron at high pressures and temperatures, Geophys. Morard, Melting of iron at Earth's inner core boundary based on fast X-ray diffraction, Science . Wicks, Melting of compressed iron by monitoring atomic dynamics, Earth Planet. Boehler, Melting of iron determined by X-ray absorption spectroscopy to 100 GPa, Proc.

Physics Doctoral Thesis Abstract: Synthesis and investigation of photocatalytic properties of BiMO (M = V, Ti, Sn) materials

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The X-ray diffraction patterns of the Bi 2 Sn 2 O 7 samples prepared at pH 12 before and after annealing from 300 °C to 700 °C is shown in Figure 5.5. When the annealing temperature was 400 °C, the diffraction peaks of the Bi 2 Sn 2 O 7 phase appeared but in very weak intensity, most of the material is amorphous. XRD patterns of the Bi 2 Sn 2 O 7. SEM images of the Bi 2 Sn 2 O 7.

Tính chất điện, từ của hệ vật liệu pervoskite La1-x¬YxFeO3

phu luc.doc

tainguyenso.vnu.edu.vn

The samples we examined under X-ray diffraction using D5005-Bruker X-ray diffractometer and Cu-Kα radiation. RESULTS AND DISCUSSION The X-ray diffraction analysis of (La1-xYx)FeO3 indicates that all samples possess an orthorhombic structure. The lattice parameters (a, b, c), tolerance factor (t), and RA, RB radii of A and B of the samles (La1-xYx)FeO3 as function of Y content are listed in the table 1. 0.645 0.25. La0.75Y0.25FeO3. 0.645 0.45. La0.55Y0.45FeO3.

Khoá luận tốt nghiệp Sư phạm Hoá học: Tổng hợp và khảo sát các yếu tố ảnh hưởng đến quá trình điều chế Zeolite X từ tro trấu

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NỘI DUNG VÀ PHƯƠNG PHÁP NGHIÊN CỨU. 2.2 PHƯƠNG PHÁP NGHIÊN CỨU. 2.2.2 Phương pháp nhiễu xạ tia X (X – Ray Diffraction. 2.2.3 Phương pháp kính hiển vi điện tử quét (SEM. 2.2.4 Phương pháp xác định diện tíc bề mặt riêng (BET.

A Simple, One-step, Seedless Hydrothermal Growth of ZnO Nanorods on Printed Circuit Board Substrate

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The crystal structure of the ZnO nanorods was characterized by X-ray diffraction (X-ray Powder Diffraction System D5000 Siemens) and Raman spectroscopy (Labram Hr800, Horiba). The morphology of the sample surface was examined by scanning electron microscopy (SEM) (Nova NanoSEM 450). As shown in Figure 2, well-aligned ZnO nanorods are observed to stand vertically on PCB substrates at a high density.